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Center for Nonlinear Studies |
An Electron Beam Ion Trap (EBIT) can produce practically any ion of any element under well-defined experimental conditions and therefore EBITs have become a reliable and . I will present an overview of the recent spectroscopic work performed on the EBIT at the National Institute of Standards and Technology (NIST). The x-ray and EUV spectra from highly-charged high-Z ions (Hf, Ta, W and Au; ion charges between 35 and 68) with open M- and N-shells were accurately measured and analyzed using the extensive collisional-radiative (CR) modeling of the EBIT plasma which was instrumental in identification of a large number of new allowed and forbidden spectral lines. I will discuss how these lines can be used for diagnostics of hot plasmas in current and future fusion devices, including ITER.
Host: James Colgan, T-1, 5-0291, jcolgan@lanl.gov